Microscope



Nov. 10, 1942. v l. MARTON 2,301,302

` MIcRoscoPE Original Filed Jan. 27, 1959 2 Sheets-Sheet 1 Fia. 1.

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unirse srarss PATENT oFFicE 2,301,392 rvncnoscors parisiens Merten,couingsweec, N.v r., assigner to Radio @orporation of America,` acorporation of Delaware @riginal application January 27, i939, SerialNo. i 253,@29. Divided and this application November 2i, i939, SerialNc. 305,432

t creams'. (ci. ca -sa) This application is a division of applicantscotronic lenses i9, 2i. A suitable eyepiece 23 is pending applicationSerial No. 253,029, iiled Janarranged on the side or the envelope and awinuary 27, 1939, and entitled Electronic and light dow is arranged atthe base of the envelope microscopes, which latter application hasissued for viewing the fluorescent screen. as Patent 2,233,286, February25, 194i. While 5A The light lens system of the microscope will be y lthe said application relates to combined light and described byTeferringto Fig. 2. A Structure 2l electronic microscopes, the instantinvention refor housing an eyepiece iS fastened t0 the casing lates to alight microscope in which light is con- 29. The eyepiece 32, includingsuitable lenses 3l, centrated on the object to be imaged by means isarranged Within en aperture -3|- Source 0f of reiiectors. Moreparticularly, the invention l0 lightfwhich may be en electric light With911 relates to a light microscope in which light may annular-shapedenvelope, is located within *therel "er e be passed through a lenssystem, through the envelope. A mirror is positioned at a suitableobject to be imaged, end reflected through the angle with respect t0 theeyepiece for reiiecting Object end the lens system to an eyepiece. thelight on the objective lens 31. The objective -The invention hasparticularutility in a com- 15 lens may consist oi the conventionalarrangement bined electronic and light microscope in which of refractivelenses 39, el, 43 of diierent matethe object is located at a commonfocal point to rials arranged to correct for aberrations. A small euewfor registering simu1teneous1y light end aperture t5 is locatedsubstantially at the center electronic images,` This arrangement is bestof the several lenses. The aperture is used in made by pi ovidngastraight ninterrupeetltwcompned electronic and lig'ht' microscopes morefor the electron-beam which forms the electron fullydiscidredun-erblicantapgent application image. Such path may be throughapertures in to which reference has been made. The aperture the lightlenses and reectors. If the microscope ,may be emitted if Only thellghtrmicrcsccpe iS is used only as a light microscope, the apertures I'may be omitted. rt is one er the objects or the 2t If thelishtrmicroseope is used with the @ieeinvention to provide a lightmicroscope in which tronic microscope, eleiftnlus are PeSSed through enaperture is arranged in the lens system. Anthe aperture which ispreferably-lined with a meother object is to provide means in o. lightmicrotallic v tube 41 or conductive coating;`Y The tube scope forconcentrating light on the specimen or 0I' cceting iS`c0nnected toground by means ci object after the light has passed through the 3oconductive coating transparent to light which is specimen. An additionalobject is to condense arranged onthe surface -of one of the lenses.light on a specimen or object by means of a The conducting coat isconnected to the metallic spherical reilector. A further object; is topro.. elements of the microscope. The function ci`the\ vide means havingespecial utility in an electronic metallic tube which lines theapertures is to pre .Y

microscope, for forming alight image oi the spec 35 vent an accumulationof electrons on the lens imen or object to be imaged. system which mightdiuse the electron beam.

The invention will be described by reference to OPDGSite the last lens43 0f the light Objective the accompanying drawings. in which Figure 1lens system is arranged a spherical reector @c is an elevational view 0fone embodiment of an which reflects the light'through the 'specimen de.electronic and light microscope; Figure 2 is an 40. The Specimen iSPositioned at the center 0i ciu'-s enlarged sectional view of thelight-lens system vature of the reilector. While any suitable means inthe microscope of Figure l; and Figures 3, 4,- may be used to positionand support the object 5, 6 and 'I are schematic views of variousarrangeor specimen, one suitable adjustable mechanism ments of lightlenses which may be used in comiS ShOWn in the cOPendinB applicationSerial No. bination with me reflector. 45 265,375, iiled March 31, 1939,by Ladislaus Mar- Referring to Fig. 1, an envelope l is exhausted t0n.end entitled Device for inserting objects by a vacuum pumpe. Within theenvelope are into a vacuum, issued as Patent 2,209,973, N0,- arranged anelectron-emitting element 5,- deflecvember 12, 1940. At this POSlticn.the light freni tor plates i, diaphragms 9, a combinedlight obtheobjective lens system will be concentrated, jective and electronic lensIl, which willbe more after reection, on the specimen with the fullfully described hereinafter, a photographic plate numerical aperture ofthe objective. The use of holder I3, and a iluorescentscreen I5.External a spherical reflector for condensing the light at tu theenvelope is arranged a nexible joint I1, the specimen is not only a veryeneetive method which permits the initial centering o! the cathofilluminating the specimen but also saves space, ode ray stream. Theenvelope also includes elecwhich is ata premium in the region of thespeci- .light source that both the mirror 35 and the spherical reilector48 include apertures 5| 53 through which the electron beam may bepassed.

While one arrangement of the light source, light reflector and eyepiecehas been shown in Figs. l and 2, it should be understoodthat otherarrangements may be employed in connection with Figs. 3 through rl towhich reference will now be made. Similar reference numerals willindicate similar parts.

In Fig. 3, the eyepiece is surrounded by the Ils. The mirror |2|includes an aperture |23. The objective lens is represented by the blockand the specimen by the line |21.

arrangement is not essentially different from the arrangementillustrated in Fig. 2.

In Fig. 4, the light ||9 is arranged at a point more remote from theeyepiece ||1 and is reilected by half-silvered mirror |29. The balanceof the arrangement is similar to Fig. 3.

In Fig. 5, the eyepiece ||1 is arranged so that the image of thespecimen |21 which is reflected by a mirror |3| is viewed through theaperture |22 in the mirror I 2| which reilects light from the source||9.

In Fig. 6, the light source I9 is arranged above the mirror |23 which ishalf-silvered and is remote from the eyepiece I1. The half-silveredmirror 2| passes the light from the source Il! to the objective lens |25and reflects the image of the specimen |21 upon the eyepiece ||1.

In Fig. 7, the light source and mirror |2| are arranged as in Fig. 6,but, in order to obtain a longer distance from the `specimen |21 totheeyepiece ||1, an additional mirror |3|. is arranged as-in Fig. 5.

v'.l'hus I have described a microscope in which the specimen may beobserved by passing lightl through the lens systemv and the specimen andhence to avspherical eector lwhich condenses or concentrates the lighton the specimen. 'I'he reflected light passes through the lens system tothe eyepiece, where the image may be observed. Various arrangementspflight systemsmay be employed to obtain/the desired focal conditions.Whenused"`in combination with an electronic ,.micscope, the light lensand reflectors are apertured for the electron beam. The aperture in thelight lens has no detrimental ei'iect on the image but a larger lens isrequired to compensate for the hole.

I claim as my invention:

l. A light microscope for use in lconjunction with apparatus of thetypeiadapted to apply an sides of the object to be imaged, a source oflight located on the objective lens side of said object. means locatedon the objective lens side of said object for directing said light onsaid lens, said lens directing light passing therethrough upon saidspherical reflector, said reilector reflecting said light through saidobject and -thence through said lens, an eyepiece disposed at an anglewith respect to said axis and on the objective lens side of said object,and means located on the objective 'lens side of said object and infront of said eyepiece for directing light reflected from said sphericalreiiector and passing back through said refractive objective lens uponsaid eyepiece.

3. A microscope for imaging an object including, in combination, Aarefractive objective lens, a spherical reilector, said lens and saidspherical reector being coaxial and located on opposite sides oftheobject to be imaged, a source of light located on the objective lensside of said object, means located on the objective lens side of saidobject for directing said light on said lens, said lens directing lightpassing therethrough upon said spherical reflector, said .reflectorreflecting said light through said object and thence through said lens,an eyepiece disposed at an anglewith respect to said axis and on theobjective lens side oi' said object, and a mirror inclined at 45 to saidaxis and located on the objective lens side of said object and in frontof said eyepiece for directing light reflected from said sphericalreflector and passing back through saidl refractive objective lens uponsaid eyepiece.

4. A microscope for imaging an object including, in combination, arefractive objective lens, a spherical reflector, said lens and saidspherical reflector being coaxially located on opposite sides of theobject to be imaged,a source of light 1ocated on the objective lens sideof said object and.

a mirror including an aperture located and on the said directed lightpassing through said lens being reflected by said spherical reflectorupon said object and thence upon said electron beam to the object to beobserved, said light microscope comprising a source of light, a lightrefractive objective lens located on one side of the object and adaptedto transmit an optical image of said object, a mirror for directing saidlight to said objective'lens, a reflector located .on the'other side ofsaid object and adapted to concentrate the light which passes vthroughsaid lens upon said object, and means for viewing the image transmittedin the return direction through said objective lens; said mirror, saidobjective lens and said reflector each being provided with an aperturethrough which said electron beam may be passed substantially unimpeded.

2. A microscope for imaging an object includl ing. in combination, arefractive objective lens, a

spherical reflector, said lens and saidy spherical lens, and an eyepieceso arranged with respect to said mirror that the said refractiveobjective lens after reflection from tliie spherical reilector isdirected upon said eyep ece.

5. A microscope for imaging an object including a source of lightlocated on one side of said object, a refractive objective lens locatedon said one side, means located on said one side for directing saidlight onto said lens, and a spherical reflector positioned on the otherside of said ob-v ject forcondensing said `light after it passes throughsaid lens and through said object on the portion of the object to beimaged and thence through said. refractive objective lens, said portionbeing positionedlat the focus'of said lens.

6. A microscope for imaging anY object including a source of light'located -on one side of said object, a refractive objective lens 'forcondensing said light on an object and for imaging said object locatedon said one side, and means located on the othervside of said object forreflecting on said object at least a portion of said light after itpasses through said lens and through said object and thence through saidrefractive objective lens to form an image oi' said portion of saidobject.

7. 'I'he invention as set forth in claim 6 and wherein means areprovided for dischargingelectrons reaching the walls of said apertures.

LADISLAUS MARTON.

light passing back through

